N. Xu et al., PRODUCTION OF INTENSE ATOMIC NITROGEN BEAM USED FOR DOPING AND SYNTHESIS OF NITRIDE FILM, Applied physics letters, 69(10), 1996, pp. 1364-1366
An are-heated source for producing an intense nitrogen atom beam with
intensity of 10(19) atoms/sr s and kinetic energies of 0.5-4 eV is pre
sented. The are discharge has been carried out in pure nitrogen gas an
d maintained stable in an are operating pressure of 30-300 Torr, The b
eam kinetic energy changes with the are pressure, and is insensitive t
o the are current. Auger electron spectroscopy analysis showed that a
TiNO layer with a thickness of about 100 Angstrom was formed on the sm
ooth Ti wafer at room temperature with interaction of the atomic nitro
gen beam. (C) 1996 American Institute of Physics.