ZNSE FOR MIRROR PASSIVATION OF HIGH-POWER GAAS BASED LASERS

Citation
N. Chand et al., ZNSE FOR MIRROR PASSIVATION OF HIGH-POWER GAAS BASED LASERS, Electronics Letters, 32(17), 1996, pp. 1595-1596
Citations number
7
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00135194
Volume
32
Issue
17
Year of publication
1996
Pages
1595 - 1596
Database
ISI
SICI code
0013-5194(1996)32:17<1595:ZFMPOH>2.0.ZU;2-X
Abstract
The authors report a method for passivating vacuum cleaved facets of h igh power GaAs based lasers using a thin fam of ZnSe formed by molecul ar beam deposition for preventing facet degradation, and thus for impr oving their long term stability and reliability at high power operatio n. ZnSe has a large bandgap of 2.7eV and a lattice constant close to t hat of GaAs with a lattice mismatch of only 0.23%. ZnSe evaporates con gruently at a comparatively low temperature of similar to 750 degrees C from an effusion cell, and deposits as stoichiometric ZnSe film. The authors have used the technique for 980nm InGaAs/lnGaP/GaAs lasers.