N. Chand et al., HIGH-RELIABILITY 1.3-MU-M INP-BASED UNCOOLED LASERS IN NONHERMETIC PACKAGES, IEEE journal of quantum electronics, 32(9), 1996, pp. 1606-1614
We report the first uncooled nonhermetic 1.3-mu m InP-based communicat
ion lasers that have reliability comparable to their hermetically pack
aged counterparts for possible applications in fiber in the loop and c
attle TV, The development of reliable nonhermetic semiconductor lasers
would not only lead to the elimination of the costs specifically asso
ciated with hermetic packaging but also lead the way for possible revo
lutionary low-cost optoelectronic packaging technologies, We have used
Fabry-Perot capped mesa buried-heterostructure (CMBH) uncooled lasers
with both bulk and MQW active regions grown on n-type InP substrates
by VPE and MOCVD, We find that the proper dielectric facet passivation
is the key to obtain high reliability in a nonhermetic environment, T
he passivation protects the laser from the ambient and maintains the p
roper facet reflectivity to achieve desired laser characteristics. The
SiO facet passivation formed by molecular beam deposition (MBD) has r
esulted in lasers with lifetimes well in excess of the reliability goa
l of 3,000 hours of operation at 85 degrees C/90% RH/30 mA aging condi
tion, Based on extrapolations derived experimentally, we calculate a 1
5-year-average device hazard rate of <300 FIT's Cas against the desire
d 1,500 FIT/s) for the combination of thermal- and humidity-induced de
gradation at an ambient condition of 45 degrees C/50% RH, For comparis
on, the average hazard rate at 45 OC and 15 years of service is approx
imately 250 FIT's for hermetic lasers of similar construction, A compa
rison of the thermal-only degradation (hermetic) to the thermal plus h
umidity-induced degradation (nonhermetic) indicates that the reliabili
ty of these nonhermetic lasers is controlled by thermal degradation on
ly and not by moisture-induced degradation. In addition to device pass
ivation for a nonhermetic environment, MBD-SiO maintains the optical,
electrical, and mechanical properties needed for high-performance lase
r systems.