A SURFACE-POTENTIAL INVESTIGATION ON TRAP CREATION IN AN ORGANIC DIELECTRIC

In view of the characteristics of space charge positions in an organic insulation dielectric under high electrical field, a surface potentia l model was put forward to investigate the dynamics of charge carrier capture. By the suggested comparative experimental method, trap creati on under high field was expressed in the increment of surface potentia l. It is shown that the structural degradation is proportional to the time of the field application and to the exponential of the inverse of the field. Such a result was also verified by photoconductive current research. Taking a certain extent of trap creation as the critical co ndition of electrical breakdown, a widely used empirical formula about electrical aging was finally deduced. (C) 1996 John Wiley & Sons, Inc .