QUANTITATIVE SURFACE STRESS MEASUREMENTS ON AU(111) ELECTRODES BY SCANNING-TUNNELING-MICROSCOPY

Using macroscopic cantilevers of evaporated Au(111) films on glass sub strates in conjunction with scanning tunneling microscopy, we performe d quantitative surface stress measurements of copper underpotential de position in bromide and chloride acid solutions. Upon differentiation of the stress data with respect to potential, definite signatures of t he corresponding voltammograms were obtained, in contrast to previous contentions of the applicability of the Lippmann equation to solid ele ctrodes which predicts such signatures only for the second derivative of the stress.