IDENTIFYING DEFECTS IN DEEP-SUBMICRON CMOS ICS

Authors
SODEN JM HAWKINS CF MILLER AC
Citation
Jm. Soden et al., IDENTIFYING DEFECTS IN DEEP-SUBMICRON CMOS ICS, IEEE spectrum, 33(9), 1996, pp. 66-71
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
IEEE spectrum → ACNP
ISSN journal
00189235
Volume
33
Issue
9
Year of publication
1996
Pages
66 - 71
Database
ISI
SICI code
0018-9235(1996)33:9<66:IDIDCI>2.0.ZU;2-R