Silicon Germanium (SiGe) power heterobipolar transistors (HBT's) with
10 and 60 x 2.25 x 15 mu m(2) emitter fingers, respectively, were fabr
icated in a completely passivated manner by a production-like process,
Each emitter stripe of the big transistors includes a ballast resista
nce of 6 Omega. Class A load pull measurements at 1.9 GHz revealed a p
ower-added efficiency (PAE) of 44% at 1-W rf output power for the 60-s
tripes transistor, In addition, a ten-finger driver HBT reached a PAE
of 72% at 0.9 GHz for class A/B operation.