SIMULTANEOUS OPTIMAL BOTTOM LINEWIDTH AND SIDE-WALL CURVATURE CONTROLOF WET ETCHING

Authors
Citation
B. Zhou et Wf. Ramirez, SIMULTANEOUS OPTIMAL BOTTOM LINEWIDTH AND SIDE-WALL CURVATURE CONTROLOF WET ETCHING, AIChE journal, 42(9), 1996, pp. 2576-2581
Citations number
17
Categorie Soggetti
Engineering, Chemical
Journal title
ISSN journal
00011541
Volume
42
Issue
9
Year of publication
1996
Pages
2576 - 2581
Database
ISI
SICI code
0001-1541(1996)42:9<2576:SOBLAS>2.0.ZU;2-L
Abstract
Etching is one of the critical steps in the fabrication of microelectr onics devices. A time-optimal control problem with a dual-term termina l cost including both bottom linewidth and side-wall curvature is form ulated to implement an optimal open-width design principle. A singular -are solution does not exist and the control action is bang-bang. The optimal switching time is analytically calculated. The feasibility and effectiveness of this technique are illustrated by simulation studies . This design and control philosophy can easily be applied to other mi croelectronics manufacturing processes.