Ev. Kasatkin et Eb. Neburchilova, SCANNING-TUNNELING-MICROSCOPY OF THE PLATINUM SURFACE UNDER CONTROLLED POTENTIAL AND THE INSTRUMENTS FOR SUCH MEASUREMENTS, Russian journal of electrochemistry, 32(8), 1996, pp. 843-853
A complex is described, based on an S4-STM-MDT instrument manufactured
domestically, for taking measurements by scanning tunneling microscop
y (STM), while the potential of the sample and the tip is controlled e
lectrochemically with the aid of a PI-50-1.1 potentiostatic complex. I
nitial results of employing STM for studying local surface topography
of single-crystal platinum and textured Pt-Ti electrodes at the bounda
ry with air and electrolyte are reported. The data obtained confirm th
e results produced by scanning electron microscopy of the surfaces stu
died under a 5000 to 15000 magnification. The possibility of using the
complex described for taking STM measurements at the electrode-soluti
on interface at a potential controlled to within 2 mV is shown. Atomic
resolution is attained.