SCANNING-TUNNELING-MICROSCOPY OF THE PLATINUM SURFACE UNDER CONTROLLED POTENTIAL AND THE INSTRUMENTS FOR SUCH MEASUREMENTS

A complex is described, based on an S4-STM-MDT instrument manufactured domestically, for taking measurements by scanning tunneling microscop y (STM), while the potential of the sample and the tip is controlled e lectrochemically with the aid of a PI-50-1.1 potentiostatic complex. I nitial results of employing STM for studying local surface topography of single-crystal platinum and textured Pt-Ti electrodes at the bounda ry with air and electrolyte are reported. The data obtained confirm th e results produced by scanning electron microscopy of the surfaces stu died under a 5000 to 15000 magnification. The possibility of using the complex described for taking STM measurements at the electrode-soluti on interface at a potential controlled to within 2 mV is shown. Atomic resolution is attained.