LOCAL TRANSPORT-PROPERTIES OF THIN BISMUTH-FILMS STUDIED BY SCANNING TUNNELING POTENTIOMETRY

Citation
Bg. Briner et al., LOCAL TRANSPORT-PROPERTIES OF THIN BISMUTH-FILMS STUDIED BY SCANNING TUNNELING POTENTIOMETRY, Physical review. B, Condensed matter, 54(8), 1996, pp. 5283-5286
Citations number
21
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
54
Issue
8
Year of publication
1996
Pages
5283 - 5286
Database
ISI
SICI code
0163-1829(1996)54:8<5283:LTOTBS>2.0.ZU;2-O
Abstract
Charge transport in 20-30-Angstrom-thick Bi films is studied by scanni ng tunneling potentiometry at room temperature. Deposition at T=140 K onto InP-based multilayer substrates leads to flat and continuous film s that are subjected to a lateral current density of up to 8 X 10(6) A /cm(2). We find that scattering at surface defects and grain boundarie s gives rise to discontinuities in the local electrochemical potential . In particular, we observe dipole-shaped potential variations near sm all holes in the film. The influence of diffusive and ballistic transp ort on the formation of these dipoles is discussed.