MAGNETIZATION IMAGING AT HIGH-SPATIAL-RESOLUTION USING TRANSMISSION ELECTRON-MICROSCOPY

A new method of imaging has been developed for mapping the distributio n of magnetic induction in thin films in a conventional transmission e lectron microscope. The method produces differential phase contrast im ages at high spatial resolution without using expensive additional equ ipment. The capabilities of our method are demonstrated by the measure ment of domain wall width in a NdFeB alloy specimen, and by the determ ination of the two-dimensional magnetic induction distribution in a Co /Cr/Co trilayer. (C) 1996 American Institute of Physics.