X-RAY PHOTOELECTRON-SPECTROSCOPY ON ZEOLITES AND RELATED MATERIALS

Authors
Citation
M. Stocker, X-RAY PHOTOELECTRON-SPECTROSCOPY ON ZEOLITES AND RELATED MATERIALS, Microporous materials, 6(5-6), 1996, pp. 235-257
Citations number
113
Categorie Soggetti
Chemistry Physical","Material Science","Chemistry Applied
Journal title
ISSN journal
09276513
Volume
6
Issue
5-6
Year of publication
1996
Pages
235 - 257
Database
ISI
SICI code
0927-6513(1996)6:5-6<235:XPOZAR>2.0.ZU;2-I
Abstract
XPS has become an important tool for the characterization of surface p roperties of zeolites and related materials. Since catalysis is mainly a surface phenomenon detailed knowledge of the behavior of zeolites a nd related materials is valuable with respect to the application of th ose materials in connection with catalyzed chemical reactions and proc esses. After a short introduction of the basic principles of XPS some general aspects are addressed before the more specific items related t o XPS investigations of zeolites and related materials are discussed. These chapters are followed by the characteristics of zeolites and rel ated materials studied by XPS in relation to the surface properties, t he nature and electronic state of metals, their redox behavior as well as investigations of metal clusters/complexes in zeolites and related materials. Furthermore, the dispersion of metals and metal oxides, th e application in catalysis, the coke formation and finally the acidity and basicity of zeolites will be addressed.