TIME-RESOLVED SPECTROSCOPY FOR RADIATION-DAMAGE PROCESSES INDUCED BY ELECTRONIC EXCITATION IN INSULATORS

Citation
K. Tanimura et al., TIME-RESOLVED SPECTROSCOPY FOR RADIATION-DAMAGE PROCESSES INDUCED BY ELECTRONIC EXCITATION IN INSULATORS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 116(1-4), 1996, pp. 26-32
Citations number
41
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
116
Issue
1-4
Year of publication
1996
Pages
26 - 32
Database
ISI
SICI code
0168-583X(1996)116:1-4<26:TSFRPI>2.0.ZU;2-G
Abstract
We review current studies by means of femtosecond time resolved spectr oscopy on defect formation induced by valence-electron excitation in h alide crystals. We first summarize the characteristics of several tran sient relaxed configurations of electron-hole pairs or excitons which play important roles in the defect formation process. Then, the result s on the self-trapping process of holes in this material are described to show the specific feature revealed by the femtosecond spectroscopy . Finally, the dynamics of the Frenkel pair formation in alkali halide crystals is discussed based on the results obtained for several cryst als at wide temperature range from 5 to 300 K. Emphasis is placed on t he new feature of damage mechanism which rakes place during the lattic e relaxation of the localized electron-hole pairs.