SULFUR SEGREGATION ON POLYCRYSTALLINE NICKEL - ARTIFACTS FROM CRYSTALLOGRAPHIC EFFECTS IN THE AUGER SIGNAL

Citation
Dr. Batchelor et al., SULFUR SEGREGATION ON POLYCRYSTALLINE NICKEL - ARTIFACTS FROM CRYSTALLOGRAPHIC EFFECTS IN THE AUGER SIGNAL, Surface and interface analysis, 24(13), 1996, pp. 875-880
Citations number
23
Categorie Soggetti
Chemistry Physical
ISSN journal
01422421
Volume
24
Issue
13
Year of publication
1996
Pages
875 - 880
Database
ISI
SICI code
0142-2421(1996)24:13<875:SSOPN->2.0.ZU;2-Y
Abstract
Sulphur segregation levels on various grains of a polycrystalline nick el sample have been measured. If the high-energy nickel Auger signal i s used as a reference, variations of up to 30% in the S/Ni ratio are s een. This large change in sulphur level results from crystallographic effects, as evidenced by the different variation of the high- and low- energy nickel Auger signals as the specimen tilt angle is varied. Of t he two processes responsible for such effects, primary beam channellin g and Auger electron diffraction, the latter is found to be important. Use of the background as a reference reduced the variation of the sul phur signal to within the error bars of the measurement of similar to 10%.