Dr. Batchelor et al., SULFUR SEGREGATION ON POLYCRYSTALLINE NICKEL - ARTIFACTS FROM CRYSTALLOGRAPHIC EFFECTS IN THE AUGER SIGNAL, Surface and interface analysis, 24(13), 1996, pp. 875-880
Sulphur segregation levels on various grains of a polycrystalline nick
el sample have been measured. If the high-energy nickel Auger signal i
s used as a reference, variations of up to 30% in the S/Ni ratio are s
een. This large change in sulphur level results from crystallographic
effects, as evidenced by the different variation of the high- and low-
energy nickel Auger signals as the specimen tilt angle is varied. Of t
he two processes responsible for such effects, primary beam channellin
g and Auger electron diffraction, the latter is found to be important.
Use of the background as a reference reduced the variation of the sul
phur signal to within the error bars of the measurement of similar to
10%.