The diffusion of copper in semi-insulating liquid-encapsulated-Czochra
lski-grown gallium arsenide at 800 degrees C was examined by photolumi
nescence, photoetching, secondary ion mass spectroscopy, and temperatu
re dependent Hall measurements. A diffusion rate of 4.5 x 10(-6) cm(2)
s(-1) obtained. It could be estimated that the diffusion takes place
predominantly by substitution on lattice sites. Diffusing copper migra
tes preferentially along the walls of the dislocation cellular network
. (C) 1996 American Institute of Physics.