HIGH-TEMPERATURE POLARIZATION RETENTION OF A PB(ZR0.52TI0.48)O-3 YBA2CU3O7-X MEMORY CELL/

Authors
ZOMORRODIAN AR LIN H WU NJ HUANG TQ LIU D IGNATIEV A
Citation
Ar. Zomorrodian et al., HIGH-TEMPERATURE POLARIZATION RETENTION OF A PB(ZR0.52TI0.48)O-3 YBA2CU3O7-X MEMORY CELL/, Applied physics letters, 69(12), 1996, pp. 1789-1791
Citations number
17
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
69
Issue
12
Year of publication
1996
Pages
1789 - 1791
Database
ISI
SICI code
0003-6951(1996)69:12<1789:HPROAP>2.0.ZU;2-A
Abstract
Polarization retention for Au/Pb(Zr0.52Ti0.48)O-3/YBa2Cu3O7-x ferroele ctric capacitors has been studied at elevated temperatures. A device w ith an effective area of 4 x 10(-3) cm and 1 mu m thickness was fabric ated, and its retention measured at 150 degrees C and 200 degrees C. T he retention was studied for two polarization directions in Pb(Zr0.52T i0.48)O-3 (PZT) by the pyroelectric current and phase detection method as well as by the conventional double pulse method. A polarization de gradation of less than 5.5% was detected for PZT at 200 degrees C for more than 24 h. (C) 1996 American Institute of Physics.