EXCITED OXYGEN BEAM BY RF TYPE MULTICAPILLARY ION-SOURCE

Citation
A. Okamoto et al., EXCITED OXYGEN BEAM BY RF TYPE MULTICAPILLARY ION-SOURCE, Thin solid films, 282(1-2), 1996, pp. 172-174
Citations number
4
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
282
Issue
1-2
Year of publication
1996
Pages
172 - 174
Database
ISI
SICI code
0040-6090(1996)282:1-2<172:EOBBRT>2.0.ZU;2-W
Abstract
We have developed a compact ion source for ion-assisted film formation . This ion source has two specific features, The first is the ability to feed the discharge gas through a multicapillary nozzle that consist s of a few hundred bundled capillaries. Consequently, the gaseous flow becomes intense and collimated. The second feature is producing the p lasma by inductive coupled R.F. discharge. Since the R.F. coil is not exposed in the plasma, this ion source can operate with various reacti ve gases. Moreover, since ions can be extracted into the chamber witho ut extraction grids, the ion energy can be low. It is found that the e xcited oxygen beam produced by this method includes oxygen ions and at omic oxygen. The flux of excited oxygen species is calculated from the increasing mass of an oxidized silver thin film bombarded by the exci ted oxygen beam. In the pressure range from 10(-1) to 10(-2) Pa, a flu x density of excited oxygen species above 10(16) atoms cm(-2) s(-1) is obtained.