M. Komiyama et al., SIMULATION OF ATOMIC-FORCE MICROSCOPY IMAGE VARIATIONS DUE TO TIP APEX SIZE - APPEARANCE OF HALF SPOTS, Thin solid films, 282(1-2), 1996, pp. 580-583
Using a recently developed atomic force microscopy (AFM) simulator ACC
ESS (AFM simulation Code for Calculating and Evaluating Surface Struct
ures), effects of tip apex size on AFM images were examined. A metal t
ip-metal sample system consisting of iron tip and copper sample was em
ployed as a model system. Structures with half the surface periodicity
, which have been observed in actual AFM measurements, were observed a
t certain tip apex registries. Conditions for their appearances were e
xamined.