SIMULATION OF ATOMIC-FORCE MICROSCOPY IMAGE VARIATIONS DUE TO TIP APEX SIZE - APPEARANCE OF HALF SPOTS

Citation
M. Komiyama et al., SIMULATION OF ATOMIC-FORCE MICROSCOPY IMAGE VARIATIONS DUE TO TIP APEX SIZE - APPEARANCE OF HALF SPOTS, Thin solid films, 282(1-2), 1996, pp. 580-583
Citations number
17
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
282
Issue
1-2
Year of publication
1996
Pages
580 - 583
Database
ISI
SICI code
0040-6090(1996)282:1-2<580:SOAMIV>2.0.ZU;2-L
Abstract
Using a recently developed atomic force microscopy (AFM) simulator ACC ESS (AFM simulation Code for Calculating and Evaluating Surface Struct ures), effects of tip apex size on AFM images were examined. A metal t ip-metal sample system consisting of iron tip and copper sample was em ployed as a model system. Structures with half the surface periodicity , which have been observed in actual AFM measurements, were observed a t certain tip apex registries. Conditions for their appearances were e xamined.