HIGH-RESOLUTION ELECTRON-MICROSCOPY OF GD-AT-C-82 METAL FULLERENES GROWN ON MGO(001) SURFACES

Authors
TANAKA N HONDA Y KAWAHARA M KISHIDA M SHINOHARA H
Citation
N. Tanaka et al., HIGH-RESOLUTION ELECTRON-MICROSCOPY OF GD-AT-C-82 METAL FULLERENES GROWN ON MGO(001) SURFACES, Thin solid films, 282(1-2), 1996, pp. 613-617
Citations number
23
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
282
Issue
1-2
Year of publication
1996
Pages
613 - 617
Database
ISI
SICI code
0040-6090(1996)282:1-2<613:HEOGMF>2.0.ZU;2-G
Abstract
Isolated molecules of Gd@C-82 metallofullerenes were directly observed by high-resolution electron microscopy. The sample was prepared by va cuum deposition on MgO single crystalline (001) films in a sample-tran sfer chamber attached to an electron microscope for observation under anaerobic conditions. The image contrast corresponding to one Gd@C-82 molecule was detected as an elliptic ring with some contrast due to a Gd atom inside. The present study shows the clear possibility of study ing various types of mono-molecular level fullerenes by using high-res olution electron microscopy.