La. Nagahara et H. Tokumoto, DEVELOPMENT OF A NEAR-FIELD OPTICAL-SYSTEM FOR INVESTIGATING THIN ORGANIC FILMS, Thin solid films, 282(1-2), 1996, pp. 647-650
We describe the development of combining a commercially available scan
ning near-field optical microscope (SNOM) with a high-optical-throughp
ut spectrometer and a CCD camera for the purpose of investigating the
optical properties of thin organic films at the nanometer-scale. The c
ombined system is capable of obtaining either SNOM images or pixel-by-
pixel near-field spectroscopy in either transmission or reflection mod
e. As an initial test sample, we used a thin film of poly(phenylene vi
nylene) and tris(8-hydroxy) quinoline aluminium to obtain. both near-f
ield optical transmission and fluorescence images as well as fluoresce
nce spectra.