DEVELOPMENT OF A NEAR-FIELD OPTICAL-SYSTEM FOR INVESTIGATING THIN ORGANIC FILMS

Citation
La. Nagahara et H. Tokumoto, DEVELOPMENT OF A NEAR-FIELD OPTICAL-SYSTEM FOR INVESTIGATING THIN ORGANIC FILMS, Thin solid films, 282(1-2), 1996, pp. 647-650
Citations number
16
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
282
Issue
1-2
Year of publication
1996
Pages
647 - 650
Database
ISI
SICI code
0040-6090(1996)282:1-2<647:DOANOF>2.0.ZU;2-5
Abstract
We describe the development of combining a commercially available scan ning near-field optical microscope (SNOM) with a high-optical-throughp ut spectrometer and a CCD camera for the purpose of investigating the optical properties of thin organic films at the nanometer-scale. The c ombined system is capable of obtaining either SNOM images or pixel-by- pixel near-field spectroscopy in either transmission or reflection mod e. As an initial test sample, we used a thin film of poly(phenylene vi nylene) and tris(8-hydroxy) quinoline aluminium to obtain. both near-f ield optical transmission and fluorescence images as well as fluoresce nce spectra.