The analysis of experimental anisotropy in thin films is discussed in
this paper. The need to take dimensionality effects into consideration
is highlighted and two methods for doing this are proposed. These met
hods allow the actual surface/interface anisotropy to be extracted fro
m the experimental data. The interface dependence of surface anisotrop
y is then discussed by evoking a simple band structure picture and by
only considering hybridization effects. Despite the simplicity of this
model, it appears to be very successful in explaining known experimen
tal results.