The concentration dependence of the ferromagnetic resonance (FMR) line
width of rf-sputtered FexCo1-x alloy films on MgO(001) substrates is i
nvestigated for 9-92 GHz. The frequency-independent (inhomogeneous bro
adening) and the frequency-dependent (Gilbert damping G) contribution
are separated. G is found to exhibit a concentration dependence which
is remarkably similar to that of the g-factor with a plateau-like beha
viour on the Fe-rich side extending to x approximate to 0.5.