Magnetisation, magnetic susceptibility, resistivity, optical-reflectiv
ity and point-contact tunnelling measurements were used to study an Fe
Si single crystal. Magnetisation measurements revealed a ferromagnetic
contribution which is more pronounced below 100 K. Magnetic susceptib
ility, resistivity, far-infrared and point-contact data are consistent
with the characterisation of FeSi as a narrow-gap semiconductor or Ko
ndo insulator. Fits to our transport data suggest the formation of a g
ap at about E(g) similar to 650 K and a fit to our susceptibility data
indicates a gap at about E(g) similar to 1200 K. The point-contact ga
p is filled at about 60 K. Optical spectra show a significant reductio
n of the low frequency reflectivity below 200 K.