Spectroscopic ellipsometry has been used to follow the initial stages
of the growth of Au on both singular and vicinal Si(lll) surfaces. The
imaginary part of the pseudo dielectric function shows an distinctive
sharp peak at 2.7 eV, at the point where the single-domain pseudo-5 x
1 low energy electron diffraction pattern is strongest for Au growth
on the stepped Si(lll) surface. The singular system behaves differentl
y. The unusual optical behaviour of the Au-induced 5 x 2 reconstructio
n is attributed to the recently-discovered quasi one-dimensional elect
ronic structure of this system.