TIME-DOMAIN DIELECTRIC-SPECTROSCOPY - AN ADVANCED MEASURING SYSTEM

The new time domain measurement system for dielectric measurements is described. The current model is comprised of an IBM PC-AT/486, ''TDM-2 ,'' a new time domain measurement system, a set of thermostabilized sa mple holders, and operation and analysis software. This system is desi gned for use in the measurement of dielectric parameters of liquid and solid materials over the frequency range 100 kHz-10 GHz. Software con sists of programs of registration, accumulation and data collection, F ourier analysis, time domain treatment, analysis software: fast and re liable nonlinear curve fitting programs to determine spectroscopic par ameters and correlation analysis in time domain. The system utilizes t he difference method of measurement with the registration of primary s ignals with multiwindow nonuniform sampling. Such a system permits the overlap of a frequency range of five orders in a single measurement. (C) 1996 American Institute of Physics.