Dv. Ivanov et A. Yelon, CHEMICAL-SENSITIVITY OF THE THICKNESS-SHEAR-MODE QUARTZ-RESONATOR NANOBALANCE, Journal of the Electrochemical Society, 143(9), 1996, pp. 2835-2841
The thickness-shear-mode quartz resonator, known as an electrochemical
quartz-crystal nanobalance (EQCN), is widely used as a mass-sensitive
detector in microgravimetry electrochemical experiments. Using the ac
oustic-wave model, we show that in experiments where the load film is
involved in some chemical reaction, the resonance-frequency shifts are
due not only to thickness-related mass changes in the load film, but
also to changes in the film density or acoustic properties. Such effec
ts may take place during electrochemical experiments such as corrosion
, ion intercalation, oxidation-reduction, phosphatation, or any other
chemical modification of the film. In such eases, the resonance-freque
ncy shifts are due to the change both of mass and of resonator-film ac
oustic coupling. The Sauerbrey relation does not take into account the
effect of acoustic coupling; the use of this relation in electrochemi
cal gravimetry may lead to erroneous conclusions. The change in resona
nce frequency due to changes in density or acoustic properties may, un
der some circumstances, provide information concerning the chemical na
ture of the load film.