SIMS AND XPS STUDY OF THE ADSORPTION OF SULFIDE COLLECTORS ON PYROXENE - A CASE FOR INADVERT METAL IN ACTIVATION

SIMS and XPS measurements were used to study the interaction between p yroxene, a magnesium silicate mineral, and sulfide collectors xanthate and thionocarbamate at pH 9. No collector adsorption could be detecte d on as-is pyroxene. Collector adsorption was observed only after pyro xene had been treated first with Cu2+ ions, washed and then treated wi th collector. XPS measurements show that Cu on pyroxene was reduced fr om cupric to cuprous upon collector adsorption suggesting the formatio n of a cuprous complex of the collector. SIMS imaging suggests that th e collector adsorption occurs at copper sites on the surface.