The energy deposit effects of radiation were studied clearly in the pa
st century; the mass deposit effects of low-energy ion beam radiation
were assumed but not certified. In this study, the products of alpha-N
aphthyl Acetic Acid (NAA) subject to implantation of 30 keV nitrogen c
ations were identified by combined gas-chromatography mass-spectrometr
y. One of the products appeared to be formed by a mass deposit effect
and another of the products appeared to be formed by an energy deposit
effect. The results indicate the dual effects of ion implantation and
also certify the assumption of mass deposit effects. Copyright (C) 19
96 Elsevier Science Ltd.