SIZE-SELECTIVE MEASUREMENTS OF SILICON-CLUSTER POLARIZABILITIES BY A CLUSTER-BEAM DEFLECTION TECHNIQUE

Average static electric polarizabilities of small and middle silicon-c luster size ranges have been measured employing a mass-selective molec ular beam deflection method. The largest studied clusters contained N = 60 atoms of silicon. The polarizabilities of the semiconductor clust ers are compared to the results obtained for metal clusters. Especiall y, the measurements of the midsized semiconductor clusters Si-30-Si-45 are discussed with regard to the predicted spherical cage-like struct ures which have been recently by Rothlisberger et al.(1) The results f or the larger clusters are analyzed in terms of recent experiments of photoluminescence of small silicon nanocrystallites.(2)