STUDY OF SMALL SEMICONDUCTOR CLUSTERS USING ANION PHOTOELECTRON-SPECTROSCOPY - GERMANIUM CLUSTERS (GE-N, N=2-15)

Authors
BURTON GR XU CS NEUMARK DM
Citation
Gr. Burton et al., STUDY OF SMALL SEMICONDUCTOR CLUSTERS USING ANION PHOTOELECTRON-SPECTROSCOPY - GERMANIUM CLUSTERS (GE-N, N=2-15), Surface review and letters, 3(1), 1996, pp. 383-388
Citations number
38
Categorie Soggetti
Physics, Condensed Matter","Physics, Atomic, Molecular & Chemical","Material Science
Journal title
Surface review and letters → ACNP
ISSN journal
0218625X
Volume
3
Issue
1
Year of publication
1996
Pages
383 - 388
Database
ISI
SICI code
0218-625X(1996)3:1<383:SOSSCU>2.0.ZU;2-Q
Abstract
The technique of anion photoelectron spectroscopy has been used at 266 , 355, and 416 nm to study small germanium clusters, Ge-n(-), n = 2-15 . The electron affinities for these cluster anions have been determine d from the photoelectron spectra. The spectra for Ge-2(-) and Ge-3(-) show well-resolved vibrational structure.