DEPOSITED MICROCLUSTERS AND THEIR INTERACTION WITH SUBSTRATE

Au, C and Sb clusters of nanometer size deposited on silicon and graph ite substrates are investigated by means of a scanning tunnelling micr oscopy (STM). Both deposition and measurements were carried out in an ultrahigh vacuum (UHV) system at room temperature. The apparent height of the clusters, which reflects not only geometry but also their elec tronic density of states, changes markedly while scanning at different voltage biases. Such behaviour depends significantly on the cluster s ize, their chemical composition and the type of substrate. We discuss the properties of clusters in terms of their size and modifications by the substrate.