Thin carbon nitride (CN) films have been prepared by de sputtering fro
m a graphite target in an argon/nitrogen plasma. The film composition
and structure were examined by energy dispersive X-ray microanalysis,
Rutherford back-scattering and transmission electron microscopy. The m
icrohardness of the films was measured with both Vickers micro-indenta
tion and a depth-sensing indentation technique. The resistance of the
films to small-scale abrasion was evaluated with a novel micro-scale a
brasion test. The hardness indentations and wear scars were studied by
scanning electron microscopy. The properties of the films were compar
ed with those of titanium nitride (TiN) films deposited using the same
technique. The CN films showed significantly greater elastic recovery
of the hardness indentations than TiN, and were more ductile in their
response to indentation. Prime novelty. Increased understanding of th
e hardness and abrasion resistance of amorphous carbon nitride films.