An x-ray diffraction study of YBa2Cu3O7-x (YBCO) films deposited on YA
lO3 (001) substrates by metal organic chemical vapor deposition is rep
orted, The twinning orientation of YBCO on YAlO3 is compared to the on
e observed for films deposited on MgO (001), SrTiO3 (001), and LaAlO3
(012) substrates. The phi scans performed on hhl type reflections and
the grazing incidence x-ray diffraction on the 020/200 reflections of
YBCO reveal a particular epitaxial relationship on YAlO3: there is onl
y one twinning direction relatively to the substrate. The [110] and [1
(1) over bar 0] directions of YBCO are aligned with the [010] directi
on of YAlO3. This twinning geometry may be explained by coherency stra
ins. (C) 1996 American Institute of Physics.