LOCALIZATION IN CR-1-XFEX AMORPHOUS FILMS

The electrical resistivity has been measured as a function of temperat ure between 1.5-300 K for amorphous Cr1-xFex alloys with x = 0.176, 0. 22, 0.26. The resistivities all show square-root temperature dependenc es below the minima temperatures. The high-held magnetoresistance (H v aries between 0-120 kOe) can be accounted for in theoretical models of localization in the presence of strong spin-orbit interaction. In add ition, the spin-flip scattering rate due to local spin fluctuations de creases with increasing temperature and then levels off at about T = 5 0 K in a manner consistent with the magnetic state of the sample, whil e the inelastic scattering rate in this range remains almost of the sa me order. Furthermore, the magnetic anisotropy of the resistivity toge ther with the magnetization data show that the magnetic order is progr essively suppressed with increasing Fe content.