M. Sicha et al., THE INTERACTION OF THE SUPERSONIC PLASMA-JET WITH THE SUBSTRATE IN THE RF PLASMA-CHEMICAL REACTOR, Contributions to Plasma Physics, 36(5), 1996, pp. 605-611
Although the plasma-chemical processes and properties of the deposited
thin film can strongly depend on the interaction of the supersonic pl
asma jet channel with the substrate, up to now the study of this pheno
menon has not yet been done. We decided to study this interaction by m
eans of CCD camera. The presented results indicate that the light inte
nsity recorded close to the substrate can be used as a measure of the
intensity of plasma-chemical deposition processes on the substrate sur
face.