CONTAINING PAPERS PRESENTED AT THE 4TH INTERNATIONAL WORKSHOP ON BEAMINJECTION ASSESSMENT OF DEFECTS IN SEMICONDUCTORS (BIADS 96), 3-6 JUNE 1996, EL ESCORIAL, SPAIN - FOREWORD

Authors
PIQUERAS J FERNANDEZ P MENDEZ B
Citation
J. Piqueras et al., CONTAINING PAPERS PRESENTED AT THE 4TH INTERNATIONAL WORKSHOP ON BEAMINJECTION ASSESSMENT OF DEFECTS IN SEMICONDUCTORS (BIADS 96), 3-6 JUNE 1996, EL ESCORIAL, SPAIN - FOREWORD, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 9-9
Citations number
NO
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Materials science & engineering. B, Solid-state materials for advanced technology → ACNP
ISSN journal
09215107
Volume
42
Issue
1-3
Year of publication
1996
Pages
9 - 9
Database
ISI
SICI code
0921-5107(1996)42:1-3<9:CPPAT4>2.0.ZU;2-7