P. Martin et al., A STUDY OF DISLOCATIONS IN GAAS-TE USING ELECTRON AND OPTICAL BEAMS, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 225-229
Dislocation atmospheres in bulk GaAs:Te have been studied using differ
ent probe beam techniques, either optical or electronic. The recombina
tive atmospheres were chemically revealed by DSL and then studied by e
lectron beam induced current (EBIC) and microRaman spectroscopy. Carri
er depletion of local crystal misorientations were the main observatio
ns. Transmission electron microscopy (TEM) allowed an identification o
f the microstructure of these atmospheres. The formation of microloops
appears as the mean reason for the structural changes observed. A pos
sible formation mechanism is discussed.