A. Cremades et al., CATHODOLUMINESCENCE STUDY OF GAN EPITAXIAL LAYERS, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 230-234
GaN epitaxial layers have been investigated by cathodoluminescence (CL
) in the scanning electron microscope (SEM). The most prominent featur
e of the spectra is a complex band at 2.2 eV, whose evolution with tem
perature and excitation density suggests emission mechanisms involving
a deep center and donor-donor or donor-acceptor pairs. Time resolved
photoluminescence (TRPL) measurements confirm the involvement of a dee
p center in the emission. CL images reveal that the centers responsibl
e for this emission decorate grain boundaries. Emission bands al 2.87
eV and 1.31 eV have been also detected in the films.