U. Pal et al., NEAR BAND-GAP PHOTOREFLECTANCE STUDIES IN CDTE, CDTE-V AND CDTE-GE CRYSTALS, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 297-301
The contactless modulation spectroscopy technique of photoreflectance
(PR) has been used to study the near band edge transitions in CdTe, Cd
Te:V and CdTe:Ge bulk crystals in the range of 14 and 400 K for the fi
rst time. The lineshape of the PR spectra for the crystals is seen to
follow the third derivative functional form (TDFF) of electroreflectan
ce (ER) in the low held limit. Using the line shape analysis of the sp
ectra at different temperatures, the variation of band gap (E(0)), pha
se factor (theta) and energy broadening parameter (Gamma) with tempera
ture are studied. The temperature variation of band gap for these crys
tals is seen to follow the Varshni relation with coefficient values al
pha = 4.357 x 10(-4) eV K-1, beta = 183.4 K for undoped, alpha = 4.635
x 10(-4) eV K-1, beta = 184.5 K for vanadium-doped and alpha = 4.508
x 10(-4) eV K-1, beta = 230.5 K for Ge doped crystals. The Varshni rel
ation is found to be valid for the whole range of temperature studied
for undoped and Ge-doped crystals, where as for V-doped crystals, Vars
hni relation is valid upto about 250 K. Effects of vanadium and german
ium doping on the energy broadening parameter in CdTe are discussed.