GROWTH OF GAAS CRYSTALS BY VGF AT DIFFERENT AS SOURCE TEMPERATURES

Citation
C. Frank et al., GROWTH OF GAAS CRYSTALS BY VGF AT DIFFERENT AS SOURCE TEMPERATURES, Crystal research and technology, 31(6), 1996, pp. 753-761
Citations number
21
Categorie Soggetti
Crystallography
ISSN journal
02321300
Volume
31
Issue
6
Year of publication
1996
Pages
753 - 761
Database
ISI
SICI code
0232-1300(1996)31:6<753:GOGCBV>2.0.ZU;2-0
Abstract
The influence of the As source temperature on the properties of undope d [100] orientated GaAs crystals during VGF crystal growth was investi gated in the range of T-As = 600 to 631 degrees C. The crystal morphol ogy has shown significant differences. A monocrystalline growth is obs erved in the range of T-As = 607 to 620 degrees C. The EPD values are in the range of 10(3) cm(-2) irrespective of the preset temperature of the As source. A decrease in the As source temperature from 620 degre es C to 607 degrees C will result in a reduced concentration of the in trinsic defect EL2 from 0.8 . 10(16) cm(-3) to 0.6 . 10(16) cm(-3).