The influence of the As source temperature on the properties of undope
d [100] orientated GaAs crystals during VGF crystal growth was investi
gated in the range of T-As = 600 to 631 degrees C. The crystal morphol
ogy has shown significant differences. A monocrystalline growth is obs
erved in the range of T-As = 607 to 620 degrees C. The EPD values are
in the range of 10(3) cm(-2) irrespective of the preset temperature of
the As source. A decrease in the As source temperature from 620 degre
es C to 607 degrees C will result in a reduced concentration of the in
trinsic defect EL2 from 0.8 . 10(16) cm(-3) to 0.6 . 10(16) cm(-3).