A variant of the powerful thin-film needle design technique, which was
first described by Tikhonravov and his co-workers, is described. In t
his method thin layers are introduced at optimum positions within the
refractive-index profile of a given multilayer system. In the original
method the optimum locations for the layer insertions are calculated
analytically, whereas in this variant of the method they are determine
d numerically. This approach, although somewhat slower, is very flexib
le. With the numerical needle method it is easy to define a merit func
tion that consists of quite complex spectral quantities, such as Commi
ssion Internationale de 1'Eclairage color coordinates or custom spectr
al properties that are defined at run time. In the program described,
three different absorbing or nonabsorbing materials can be used for th
e needle layers and one or more needles can be inserted into the syste
m at any given time. Multilayer solutions can also be sought in which
the system is defined in terms of repeating groups of layers. It is al
so possible to calculate automatically a series of solutions to a part
icular problem with increasing overall thicknesses or to perform simul
taneous calculations on several different systems. Examples are given
that illustrate these various points. (C) 1996 Optical Society of Amer
ica