Room temperature operation of erbium and oxygen coimplanted GaN m-i-n
(metal-insulator-n-type) diodes is demonstrated. Erbium related electr
oluminescence at lambda=1.54 mu m was detected under reverse bias afte
r a postimplant anneal at 800 degrees C for 45 min in flowing NH3. The
integrated light emission intensity showed a linear dependence on app
lied reverse drive current. (C) 1996 American Institute of Physics.