MOLECULAR-DYNAMICS SIMULATIONS OF SILICON-WAFER BONDING

Citation
D. Conrad et al., MOLECULAR-DYNAMICS SIMULATIONS OF SILICON-WAFER BONDING, Applied physics A: Materials science & processing, 62(1), 1996, pp. 7-12
Citations number
29
Categorie Soggetti
Physics, Applied
ISSN journal
09478396
Volume
62
Issue
1
Year of publication
1996
Pages
7 - 12
Database
ISI
SICI code
0947-8396(1996)62:1<7:MSOSB>2.0.ZU;2-E
Abstract
Molecular dynamics simulations based on a modified Stillinger-Weber po tential are used to investigate the elementary steps of bonding two Si (0 0 1) wafers. The energy dissipation and thus the dynamic bonding be haviour are controlled by the transfer rates for the kinetic energy. T he applicability of the method is demonstrated by studying the interac tion of perfect wafer surfaces (UHV conditions). First calculations co vering the influence of surface steps, rotational misorientations and adsorbates are presented.