FERROELECTRIC THIN-FILMS FOR INTEGRATED SENSOR AND MEMORY DEVICES

Authors
Citation
A. Patel et Js. Obhi, FERROELECTRIC THIN-FILMS FOR INTEGRATED SENSOR AND MEMORY DEVICES, GEC journal of research, 12(3), 1995, pp. 141-152
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
02649187
Volume
12
Issue
3
Year of publication
1995
Pages
141 - 152
Database
ISI
SICI code
0264-9187(1995)12:3<141:FTFISA>2.0.ZU;2-C
Abstract
The integration of ferroelectric thin films with existing silicon proc ess technology, and with the rapidly developing area of silicon microm achining, would result in a new generation of memory and sensor device s. Ferroelectric materials have a unique range of properties such as p olarization switching, high dielectric constant pyroelectricity, piezo electricity and electro-optic effects. As a consequence, applications for thin-film devices ave diverse and include non-volatile semiconduct or memories, dynamic random access memories, thin-film capacitors, sur face acoustic wave devices, micro-actuators, pyroelectric and piezoele ctric sensors, optical waveguides, spatial light modulators and freque ncy doublers for integrated lasers. There is intensive activity world- wide in the realization of these various devices. At GEC-Marconi Mater ials Technology, Caswell, attention has focused on integrated films fo r pyroelectric detector arrays for long wavelength infra-red (LWIR) im agers, and non-volatile semiconductor memories. This paper reviews the development, current status and future prospects ferroelectric thin-f ilm fabrication techniques and discusses silicon processing and microm achining compatibility issues. In particular the use of sol-gel and du al ion beam sputtering for the deposition of films of lead zirconate t itanate (PZT) and lead lanthanum titanate (PLT) is described.