The integration of ferroelectric thin films with existing silicon proc
ess technology, and with the rapidly developing area of silicon microm
achining, would result in a new generation of memory and sensor device
s. Ferroelectric materials have a unique range of properties such as p
olarization switching, high dielectric constant pyroelectricity, piezo
electricity and electro-optic effects. As a consequence, applications
for thin-film devices ave diverse and include non-volatile semiconduct
or memories, dynamic random access memories, thin-film capacitors, sur
face acoustic wave devices, micro-actuators, pyroelectric and piezoele
ctric sensors, optical waveguides, spatial light modulators and freque
ncy doublers for integrated lasers. There is intensive activity world-
wide in the realization of these various devices. At GEC-Marconi Mater
ials Technology, Caswell, attention has focused on integrated films fo
r pyroelectric detector arrays for long wavelength infra-red (LWIR) im
agers, and non-volatile semiconductor memories. This paper reviews the
development, current status and future prospects ferroelectric thin-f
ilm fabrication techniques and discusses silicon processing and microm
achining compatibility issues. In particular the use of sol-gel and du
al ion beam sputtering for the deposition of films of lead zirconate t
itanate (PZT) and lead lanthanum titanate (PLT) is described.