This paper describes a microcomputer system using digital-signal proce
ssing for yarn-unevenness analysis. The system converts the analogue s
ignal from an Uster Tester into digital form and then analyzes the sig
nal by using digital-signal-processing techniques. The yarn unevenness
is described by four statistical parameters (statistical average, pro
bability-density function, correlation functions, and power-spectral-d
ensity function) as usually adopted for a steady stochastic process. T
he probability-density function, known to be closely correlated with f
abric-appearance quality, is derived in detail, and a new scheme for n
umerical approximation of a shorter-term signal from a longer-term one
is proposed. The system can be used to expand the use of the Uster Te
ster, providing insight for the analysis of yarn unevenness.