A NEW TEST PATTERN GENERATOR DESIGN APPRO ACH FOR VLSI BUILT-IN SELF-TESTING

Authors
YARMOLIK VN MURASHKO IA
Citation
Vn. Yarmolik et Ia. Murashko, A NEW TEST PATTERN GENERATOR DESIGN APPRO ACH FOR VLSI BUILT-IN SELF-TESTING, Avtomatika i vycislitelnaa tehnika, (6), 1995, pp. 25-35
Citations number
9
Categorie Soggetti
Computer Science Artificial Intelligence
Journal title
Avtomatika i vycislitelnaa tehnika → ACNP
ISSN journal
01324160
Issue
6
Year of publication
1995
Pages
25 - 35
Database
ISI
SICI code
0132-4160(1995):6<25:ANTPGD>2.0.ZU;2-N