Sp. Chenakin et al., COMBINED SIMS-ISS STUDY OF THE HIGH-T-C SUPERCONDUCTING COMPOUND YBA2CU3-YALYOX, Applied physics A: Materials science & processing, 62(2), 1996, pp. 175-180
Secondary ion yields, secondary ion-energy spectra and ion-scattering
spectra for high-T-c superconducting compound YBa2Cu3-yAlyOx have been
studied as a function of A1 content (y = 0-0.8). In accordance with d
ata known from literature, it was shown by Secondary-Ion Mass Spectrom
etry (SIMS) that A1 doping of YBaCuO results in the selective substitu
tion of Cu1 atoms with A1 atoms. The correlated non-monotonic variatio
ns of the secondary-ion yield, the most probable secondary ion energy
and the scattered ion yield for Y and Ba were observed with a growth o
f A1 concentration and were explained in terms of the modification of
local composition and electronic structure in the vicinity of these at
oms. The kinetics of secondary-ion emission during sputtering of the o
riginal surface layer degraded under air exposure has also been measur
ed for the YBaCuAlO samples. It was found that the ion currents ratio
Ba+/BaOH+ may characterize the level of degradation and the oxygen con
centration in Cu1-O layers.