THERMAL-RADIATION ABSORPTION IN DOPED SEMICONDUCTORS DUE TO DIRECT INTERSUBBAND TRANSITIONS

Citation
Jp. Hebb et al., THERMAL-RADIATION ABSORPTION IN DOPED SEMICONDUCTORS DUE TO DIRECT INTERSUBBAND TRANSITIONS, Journal of heat transfer, 117(4), 1995, pp. 948-954
Citations number
28
Categorie Soggetti
Engineering, Mechanical",Thermodynamics
Journal title
ISSN journal
00221481
Volume
117
Issue
4
Year of publication
1995
Pages
948 - 954
Database
ISI
SICI code
0022-1481(1995)117:4<948:TAIDSD>2.0.ZU;2-N
Abstract
This work proposes an engineering model for thermal radiation absorpti on due to direct intersubband transitions in eloped semiconductors, wh ich are excitations of bound electrons in the infrared spectral region . An existing quantum-mechanical approach is to model these transition s as a continuum of damped harmonic oscillators. This study modifies t his approach to yield a more effective method for determining the opti cal constants of doped semiconductors. The room-temperature absorptanc e spectra of p-type Gags samples with dopant concentrations from 8 X 1 0(17) to 1 X 10(20) cm(-3) are measured using a Fourier transform-infr ared spectrometer in the spectral region from 1.5 to 25 mu m. The fitt ing of these spectra using the proposed model combined with the Drude and Lorentz models provides tire optical constants and the dependence of the adjustable parameters on dopant concentration. The measured and fitted spectra agree closely. Potential applications of the model are semiconductor process control and infrared detector design.