FAULT OBSERVABILITY ANALYSIS OF ANALOG CIRCUITS IN FREQUENCY-DOMAIN

In this brief, we study the testability of analog circuits in the freq uency domain by introducing the analog fault observability concept, Th e proposed algorithm indicates the set of adequate test frequencies an d test nodes to increase fault observability. This approach combines a structural testing methodology with functionality verification to inc rease the test effectiveness and consequently the design manufacturabi lity and reliability. We analyze the case of single fault, double, and multiple faults, Concepts such as fault masking, fault dominance, fau lt equivalence, and non observable fault in analog circuits are define d and then used to evaluate testability. The theoretical aspect is bas ed on the sensitivity approach.