NOVEL FEATURES IN PROJECTILE X-RAYS AND RADIATIVE ELECTRON-CAPTURE PHOTONS EMISSION FROM HIGHLY STRIPPED CHANNELED IONS

Citation
V. Nanal et al., NOVEL FEATURES IN PROJECTILE X-RAYS AND RADIATIVE ELECTRON-CAPTURE PHOTONS EMISSION FROM HIGHLY STRIPPED CHANNELED IONS, Journal of physics. B, Atomic molecular and optical physics, 29(23), 1996, pp. 5857-5866
Citations number
23
Categorie Soggetti
Physics, Atomic, Molecular & Chemical",Optics
ISSN journal
09534075
Volume
29
Issue
23
Year of publication
1996
Pages
5857 - 5866
Database
ISI
SICI code
0953-4075(1996)29:23<5857:NFIPXA>2.0.ZU;2-4
Abstract
Novel features have been observed in the projectile x-rays and radiati ve electron capture (REC) photons emitted from bare and H-like S ions of energy varying between 90 and 143 MeV and channelled along the (100 ) direction in a Si single crystal. These features include enhancement of the photon yields along the channelled direction over that in a ra ndom case as well as their peaking close to psi(c)/2. REC measurements have also been carried out for fully stripped and II-like oxygen ions at 84 MeV. All these results have been understood in terms of the ele ctron capture and loss cross sections as well as the charge 'freezing' of channelled ions.